CrystFEL is a suite of programs for processing diffraction data acquired
"serially" in a "snapshot" manner. That means: a large number of individual
diffraction patterns, each corresponding to a random orientation of the
crystal, with little or no rotation or oscillation of the sample. This
is exactly the situation encountered when using the technique of Serial
Femtosecond Crystallography (SFX) with a free-electron laser source, which
is the application CrystFEL is primarily designed for. CrystFEL comprises
programs for indexing and integrating diffraction patterns, scaling and
merging intensities, simulating patterns, calculating figures of merit for
the data and visualising the results.